You Searched For: Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

Description: These slides are extremely hydrophobic, acetone proof, chemical resistant and autoclavable. They are perfect for controlling cross-contamination in staining, immunolabeling and immunofluorescence tests.

Supplier: Electron Microscopy Sciences

Description: For use in water analysis, culture inspection, and any fluid where particles per unit volume need to be determined. Available in two versions.

Supplier: Electron Microscopy Sciences

Description: Veco grids offer superior handling characteristics.

Supplier: Electron Microscopy Sciences

Description: Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt or shiny side. Each grid is individually inspected.

Supplier: Electron Microscopy Sciences

Description: Double grids are used mostly in metallurgical applications for supporting thin metal foils. These grids have a curved securing tab which folds to the curvature of the 'sandwiched' grid.

Supplier: Electron Microscopy Sciences

Description: All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.

Supplier: Electron Microscopy Sciences

Description: The new improved Kimball Physics Model ES-423E (Extended Life) LaB6 Cathode is a high performance, resistively heated, thermionic electron source. The improvement stability of the LaB6 crystal, results in less exposure of LaB6, which reduces Wehnelt aperture contamination. It is for use in Scanning Electron Microscopes, Transmission Electron Microscopes, Electronlithography Systems, and X-Ray Sources.

Supplier: Electron Microscopy Sciences

Description: These test specimens are excellent for comparing magnification and assessing any distortion in the image field. It is ideally useful in the context of automated counting systems to check for unsuspected distortions.

Supplier: Electron Microscopy Sciences

Description: Style 2LB/4: No teeth

Supplier: Electron Microscopy Sciences

Description: These tweezers have Zirconia ceramic precision tips.

Supplier: Electron Microscopy Sciences

Description: MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES). (Auger electron: one of the electrons ejected from an atom as a result of the internal conversion of its own X-ray in the auger effect. Auger effect: a process in which an atom singly ionized by emitting one electron with energy in the X-ray range instead of emitting the usual X-ray photon on recovery undergoes a transition in which a second electron is emitted).

Supplier: Electron Microscopy Sciences

Description: A Tripod Polisher® was designed to prepare accurately micro sizes of TEM and SEM samples.

Catalog Number: (100497-620)

Supplier: Electron Microscopy Sciences

Description: Micro Forceps MF-1, Straight, Smooth or Serrated Jaws features extra delicate tips for general precision work

Supplier: Electron Microscopy Sciences

Description: A selective diamond particle resin bonded to a uniform 3-mil polyester film backing. Excellent for polishing samples with differing hardness. Ideal for the preparation of cross sections for SEM/TEM analysis. Comes in 8" and 12" discs with plain back (P/B) or pressure sensitive adhesive back (PSA).

Supplier: Electron Microscopy Sciences

Description: These unique micro cutting tools are made using the latest grinding and polishing technology.

Supplier: Electron Microscopy Sciences

Description: These vials are designed for storage of biological material, human or animal cells, at temperatures as low as –190 °C.