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You Searched For: Graticules, Reticles and Grids


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Product Image-100491-146

Square Grid

Description: Square Grid
Catalog Number: 100491-146
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-822

Hexagonal 400 mesh, Copper

Catalog Number: 100495-822
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-102101-124

Asbstos Indx Cu Grd 100/Vl

Catalog Number: 102101-124
Supplier: Electron Microscopy Sciences


Product Image-102101-126

Asbstos Indx Ni Grd 100/Vl

Catalog Number: 102101-126
Supplier: Electron Microscopy Sciences


Product Image-102101-048

Thin Bar Hexagonal Grid

Description: Thin Bar Hexagonal Grid
Catalog Number: 102101-048
Supplier: Electron Microscopy Sciences


Product Image-102100-374

Thin Bar Hexagonal Grid

Description: Thin Bar Hexagonal Grid
Catalog Number: 102100-374
Supplier: Electron Microscopy Sciences


Product Image-102100-364

Thin Bar Hexagonal Grid

Description: Thin Bar Hexagonal Grid
Catalog Number: 102100-364
Supplier: Electron Microscopy Sciences


Product Image-102096-888

Disposable Adhesive Slide Grids

Description: Disposable Adhesive Slide Grids
Catalog Number: 102096-888
Supplier: Electron Microscopy Sciences


Image Unavailable-76439-544

EDX-XEDS TEM window grid

Description: EDX-XEDS TEM window grid
Catalog Number: 76439-544
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-598

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 9nm, Window dimension: (2) 100x1500um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 9nm, Window dimension: (2) 100x1500um
Catalog Number: 76439-598
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-596

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 9nm, Window dimension: (8) 100 sq, (1) 100x350um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 9nm, Window dimension: (8) 100 sq, (1) 100x350um
Catalog Number: 76439-596
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-594

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 5nm, Window dimension: (2) 50x1500um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 5nm, Window dimension: (2) 50x1500um
Catalog Number: 76439-594
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-590

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, Window dimension: 25um square, 5nm

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, Window dimension: 25um square, 5nm
Catalog Number: 76439-590
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-600

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 15nm, Window dimension: (8) 100 sq, (1) 100x350um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 15nm, Window dimension: (8) 100 sq, (1) 100x350um
Catalog Number: 76439-600
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-592

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 5nm, Window dimension: (8) 50um sq, 1) 50x100um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 5nm, Window dimension: (8) 50um sq, 1) 50x100um
Catalog Number: 76439-592
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-602

Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 15nm, Window dimension: (2) 100x1500um

Description: Non-Porous Pure Si TEM Window, feature imaging windows with 5 to 15 nm thickness, reducing background and interference for higher contrast imaging, Analyses of samples containing nitrogen and/or carbon is possible, Nanoporous with pores from 10-60nm, 15nm, Window dimension: (2) 100x1500um
Catalog Number: 76439-602
Supplier: ELECTRON MICROSCOPY SCIENCE
561 - 576 of 1,477