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You Searched For: Graticules, Reticles and Grids

<p><span style=Graticules, reticles, and grids are precision tools used in microscopy, optical instruments, and imaging systems to aid in measurement, alignment, and targeting. Commonly integrated into eyepieces or slide-mounted formats, they enhance accuracy during observations and support standardized data collection in research, metrology, and clinical diagnostics. With various patterns and calibrations available, these tools are adaptable to diverse analytical tasks, improving consistency and workflow efficiency across scientific and technical disciplines.

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Graticules, reticles, and grids are precision tools used in microscopy, optical instruments, and imaging systems to aid in measurement, alignment, and targeting. Commonly integrated into eyepieces or slide-mounted formats, they enhance accuracy during observations and support standardized data collection in research, metrology, and clinical diagnostics. With various patterns and calibrations available, these tools are adaptable to diverse analytical tasks, improving consistency and workflow efficiency across scientific and technical disciplines.


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Product Image-100499-026

NE56 GRATICULE, 16MM

Description: For measurement of large objects and alignment in conjunction with a graduated mechanical stage, measurements in two directions, image covers the entire field of view, broken cross lines, surface chrome image
Catalog Number: 100499-026
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100499-078

NE18 MICROMETER SCALES, 21 MM

Description: Used as a horizontal and a vertical scale, useful when interested in measurement in different axis, crossed micrometer scales 5mm long with 0.05mm subdivions, surface chrome image
Catalog Number: 100499-078
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100499-074

NE18 MICROMETER SCALES, 16 MM

Description: Used as a horizontal and a vertical scale, useful when interested in measurement in different axis, crossed micrometer scales 5mm long with 0.05mm subdivions, surface chrome image
Catalog Number: 100499-074
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100499-076

NE18 MICROMETER SCALES, 19 MM

Description: Used as a horizontal and a vertical scale, useful when interested in measurement in different axis, crossed micrometer scales 5mm long with 0.05mm subdivions, surface chrome image
Catalog Number: 100499-076
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-984

Parallel/Divider Bar R150D Ni 100/v

Catalog Number: 100495-984
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100499-220

NGW1 GRATICULE, 19MM

Description: Consists of 15 lines of equal length connecting the verticals of a regular hexagonal point network, Weibel Type 1 for stereology, surface chrome image
Catalog Number: 100499-220
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-964

Parallel/divider r100aspec, Cu

Catalog Number: 100495-964
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-972

Parallel/Divider Bar R100D Ni 100/v

Catalog Number: 100495-972
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100499-028

NE56 GRATICULE, 19MM

Description: For measurement of large objects and alignment in conjunction with a graduated mechanical stage, measurements in two directions, image covers the entire field of view, broken cross lines, surface chrome image
Catalog Number: 100499-028
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-982

Parallel/Divider Bar R150D Cu 100/v

Catalog Number: 100495-982
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100499-244

NG10 GRATICULE, 19MM

Description: Circle areas double progressively, covers particles in the range 150 micron to 0.38 micron, British Standard (BS3625/BS3260) Globes & Circles. Surface chrome image
Catalog Number: 100499-244
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100499-242

NG10 GRATICULE, 16MM

Description: Circle areas double progressively, covers particles in the range 150 micron to 0.38 micron, British Standard (BS3625/BS3260) Globes & Circles. Surface chrome image
Catalog Number: 100499-242
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100499-052

NE17 GRATICULE, 19MM

Description: Used as a horizontal and a vertical scale, useful when interested in measurement in different axis, crossed micrometer scales 10mm long with 0.1mm subdivions, surface chrome image
Catalog Number: 100499-052
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-966

Parallel/divider r100aspec, Ni

Catalog Number: 100495-966
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-992

Parallel/Divider Bar R200D Ni 100/v

Catalog Number: 100495-992
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Image Unavailable-102773-590

Omniprobe Omni Probe 4 Post Copper

Description: Lift-Out Grids Specifically Designed For In-Situ Lift-Out With Multiple Indexed Mounting Locations, Two With Vertical Bar Attachment Surfaces And Two With 'V' Shaped Alighment Surfaces.
Catalog Number: 102773-590
Supplier: Electron Microscopy Sciences


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