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LANTHANUM NICKEL, 99.9% 50G

Catalog Number: CAAA11271-18
Supplier: Thermo Scientific Chemicals

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Image Unavailable-CAAA11271-90

LANTHANUM NICKEL, 99.9% 5X50G

Catalog Number: CAAA11271-90
Supplier: Thermo Scientific Chemicals

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Product Image-CAAGG700220064

Extractor spacer lens, aluminum nitride, for 7010 Triple Quadrupole GC/MS

Description: Extractor spacer lens, aluminum nitride, for 7010 Triple Quadrupole GC/MS
Catalog Number: CAAGG700220064
Supplier: AGILENT TECHNOLOGIES, INC (CSD) CA
Product Image-76549-624

SAW BLADE CAST 940 COMP STAINLESS STEEL

Catalog Number: 76549-624
Supplier: Mortech Manufacturing
Product Image-101411-948

BORON CARBIDE POWDER, 42UM, 1LB

Description: Extreme hardness (Knoop 100g: 2900-3580 kg/mm2), Good chemical resistance, Good nuclear properties, Low density (2.52 g/cm2)
Catalog Number: 101411-948
Supplier: Electron Microscopy Sciences

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Product Image-101411-942

BORON CARBIDE POWDER, 18UM, 1LB

Description: Extreme hardness (Knoop 100g: 2900-3580 kg/mm2), Good chemical resistance, Good nuclear properties, Low density (2.52 g/cm2)
Catalog Number: 101411-942
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-76439-408

Graphene Oxide on Silicon Nitride, 2 Layers, with 2.5 um holes.

Description: Graphene Oxide on Silicon Nitride, 2 Layers, with 2.5 um holes.
Catalog Number: 76439-408
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-406

Graphene Oxide on Silicon Nitride, 2 Layers, with 2.5 um holes.

Description: Graphene Oxide on Silicon Nitride, 2 Layers, with 2.5 um holes.
Catalog Number: 76439-406
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-410

Graphene Oxide on Silicon Nitride, 2 Layers, with 2.5 um holes.

Description: Graphene Oxide on Silicon Nitride, 2 Layers, with 2.5 um holes.
Catalog Number: 76439-410
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-556

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1000um, Membrane: 100nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1000um, Membrane: 100nm
Catalog Number: 76439-556
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-560

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 2500um, Membrane: 200nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 2500um, Membrane: 200nm
Catalog Number: 76439-560
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-558

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1500um, Membrane: 200nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1500um, Membrane: 200nm
Catalog Number: 76439-558
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-554

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 100nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 100nm
Catalog Number: 76439-554
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-550

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 50nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 50nm
Catalog Number: 76439-550
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-552

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 100um, Membrane: 50nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 100um, Membrane: 50nm
Catalog Number: 76439-552
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-10811-785

UltraSOLV* Diamond ScrubPADS Pads

Description: Hydrophilic urethane foam base. Clean recessed surfaces and microporous sub-surfaces. Safely and quickly remove build-up on process equipment and eliminates contamination. Remove hard, glass-like build-up, such as that from titanium nitride. 7.6x10.2cm. 280-grit.
Catalog Number: 10811-785
Supplier: Foamtec International

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161 - 176 of 2,937