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Description: Carbon Support Film Single Hole, Type: 100 um, Thickness: 20-30 nm Extra Thick, Coating: Nickel A thin film of pure carbon deposited on the shiny side of the grid (are optically checked), Silicone free, Application: Electron Microscopy
Catalog Number: 103304-922
Supplier: Electron Microscopy Sciences


Description: Carbon Support Film Single Hole, Type: 800 um, Thickness: 20-30 nm Extra Thick, Coating: Nickel A thin film of pure carbon deposited on the shiny side of the grid (are optically checked), Silicone free, Application: Electron Microscopy
Catalog Number: 103304-934
Supplier: Electron Microscopy Sciences


Description: Carbon Support Film Single Hole, Type: 200 um, Thickness: 20-30 nm Extra Thick, Coating: Nickel A thin film of pure carbon deposited on the shiny side of the grid (are optically checked), Silicone free, Application: Electron Microscopy
Catalog Number: 103304-926
Supplier: Electron Microscopy Sciences


Description: Carbon Support Film Single Hole, Type: 600 um, Thickness: 20-30 nm Extra Thick, Coating: Nickel A thin film of pure carbon deposited on the shiny side of the grid (are optically checked), Silicone free, Application: Electron Microscopy
Catalog Number: 103304-932
Supplier: Electron Microscopy Sciences


Description: ICP-MS skimmer cone, 7700, 7800, 7850 and 8800 with x-lens, Platinum-tip with nickel base. Optional cone used with x-lens for organic solvent analysis using Oxygen/Argon option gas. Recommended to use with Platinum-tip with Nickel-plated Copper base sampler cone and brass skimmer base.
Catalog Number: CAAGG328067063
Supplier: AGILENT TECHNOLOGIES, INC (CSD) CA


Description: Skimmer cone, 7900, 8900 with x-lens ICP-MS, Platinum-tip with Nickel base. Optional cone used with x-lens for organic solvent analysis using Oxygen/Argon option gas. Recommended to use with Platinum-tip with Nickel-plated Copper base sampler cone (G3280-67142) and brass skimmer base.
Catalog Number: CAG8400-67202
Supplier: AGILENT TECHNOLOGIES, INC (CSD) CA


Description: VWR* Filter Paper, Grade 494 Filter Paper, Quantitative, Diameter: 12.5cm, Porosity: Fine, Flow rate: Slow, Particle retention: 1um, For very fine precipitates such as barium and lead sulfates, stannic and nickel sulfides, and calcium hydroxide
Catalog Number: CA28307-134
Supplier: VWR International

Catalog Number: 100495-916
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 100495-944
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 100495-938
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 76540-040
Supplier: Janitorial Supplies


Catalog Number: RK80127-800
Supplier: Restek


Description: Clear acrylic frame. Sieve opening: 10um (0.0004"). Dimensions: 8.9ODx7.6IDx3.2Hcm. Meet current sieve specifications of ASTM and ISO. Can be used with Sonic Sifter Separator.
Catalog Number: 57333-788
Supplier: ATM

Small Business Enterprise


Description: Clear acrylic frame. Sieve opening: 45um (0.0018"). Dimensions: 8.9ODx7.6IDx3.2Hcm. Meet current sieve specifications of ASTM and ISO. Can be used with Sonic Sifter Separator.
Catalog Number: 57333-802
Supplier: ATM

Small Business Enterprise


Description: Clear acrylic frame. Sieve opening: 15um (0.0006"). Dimensions: 8.9ODx7.6IDx3.2Hcm. Meet current sieve specifications of ASTM and ISO. Can be used with Sonic Sifter Separator.
Catalog Number: 57333-790
Supplier: ATM

Small Business Enterprise


Description: Clear acrylic frame. Sieve opening: 85um (0.0034"). Dimensions: 8.9ODx7.6IDx3.2Hcm. Meet current sieve specifications of ASTM and ISO. Can be used with Sonic Sifter Separator.
Catalog Number: 57333-818
Supplier: ATM

Small Business Enterprise


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