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Description: Demonstration Induction Coil, Heavy Gauge Enamelled Copper Wire Wound On Former 110 X 30 mm. Secondary Coil Of Fine Enamelled Copper Wire On Former 120 X 82 mm. Both Coils Fitted With 4 mm Sockets, With Primary Of Heavy Gauge Enamelled Copper Wire
Catalog Number: 470230-296
Supplier: Wards


Description: Foil, Type: R 0.6/1, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 0.6um, Spacing: 1um, Period: 1.6um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-016
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 0.6/1, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 0.6um, Spacing: 1um, Period: 1.6um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-122
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/20, Grid Type: Copper, 200 Mesh, with approx 1.2um circular holes and spacing of approx 20 um between the holes, used at Magnifications of 50,000x and higher, Period: 20 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)
Catalog Number: 76440-218
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/20, Grid Type: Copper, 200 Mesh, with approx 1.2um circular holes and spacing of approx 20 um between the holes, used at Magnifications of 50,000x and higher, Period: 20 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)
Catalog Number: 76440-474
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/20, Grid Type: Copper, 200 Mesh, with approx 1.2um circular holes and spacing of approx 20 um between the holes, used at Magnifications of 50,000x and higher, Period: 20 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)
Catalog Number: 76440-372
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 1.2/20um, Type: Copper Grid 300Mesh, with Carbon film, Predefined holes, Hole Size: 1.2um, Period: 21.2um, It has advantages in electron microscopy or low-energy electron point source microscopy, Space between holes is 20 um, Center to center is 21.2 um, Magnifications of 30.000x to 40.000x
Catalog Number: 76440-784
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R17/5, Grid Type: Copper, 200 Mesh, with approx 17.5 um circular holes and spacing of approx 5 um between the holes, Period: 22.5 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)/low-energy electron point source
Catalog Number: 76440-214
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R17/5, Grid Type: Copper, 200 Mesh, with approx 17.5 um circular holes and spacing of approx 5 um between the holes, Period: 22.5 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)/low-energy electron point source
Catalog Number: 76440-370
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R17/5, Grid Type: Copper, 200 Mesh, with approx 17.5 um circular holes and spacing of approx 5 um between the holes, Period: 22.5 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)/low-energy electron point source
Catalog Number: 76440-472
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 1.2/20um, Type: Copper Grid 300Mesh, with Carbon film, Predefined holes, Hole Size: 1.2um, Period: 21.2um, It has advantages in electron microscopy or low-energy electron point source microscopy, Space between holes is 20 um, Center to center is 21.2 um, Magnifications of 30.000x to 40.000x
Catalog Number: 76440-882
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/1.3, Grid Type: Copper, 200 Mesh, with approx 1.2um circular holes and spacing of approx 1.3 um between the holes, used at Magnifications of 50,000x and higher, Period: 3.7 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)
Catalog Number: 76440-198
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Skimmer cone, 7900, 8900 with x-lens ICP-MS, Platinum-tip with Nickel base. Optional cone used with x-lens for organic solvent analysis using Oxygen/Argon option gas. Recommended to use with Platinum-tip with Nickel-plated Copper base sampler cone (G3280-67142) and brass skimmer base.
Catalog Number: CAG8400-67202
Supplier: AGILENT TECHNOLOGIES, INC (CSD) CA


Description: ICP-MS skimmer cone, 7700, 7800, 7850 and 8800 with x-lens, Platinum-tip with nickel base. Optional cone used with x-lens for organic solvent analysis using Oxygen/Argon option gas. Recommended to use with Platinum-tip with Nickel-plated Copper base sampler cone and brass skimmer base.
Catalog Number: CAAGG328067063
Supplier: AGILENT TECHNOLOGIES, INC (CSD) CA


Catalog Number: 470201-516
Supplier: Arcor Electronics


Catalog Number: 470005-926
Supplier: Arcor Electronics


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