Orthophosphoric acid ≥85%, CMOS for the electronics industry, J.T.Baker®
Supplier: AVANTOR PERFORMANCE MATERIAL LLC
Synonyms:
Phosphoric acid
Management of Change (MOC) category = R
BAKR0264-05
0264-05
CAJT0264-5CS
1092.41
CAD
JT0264-5
CAJT0264-5
Orthophosphoric acid ≥85%, CMOS for the electronics industry, J.T.Baker®
Orthophosphoric acid
Formula:
H₃PO₄ MW: 98 g/mol Melting Pt: 28 °C Density: 1.71…1.87 g/cm³ (25 °C) |
MDL Number:
MFCD00011340 CAS Number: 7664-38-2 UN: 1805 ADR: 8,III |
Specification Test Results
Assay (H₃PO₄) (by acidimetry) | 85.0 - 87.0 % |
Color (APHA) | ≤ 10 5 |
Specific Gravity at 60°/60°F | 1.691 - 1.710 |
Reducing Substances | Passes Test |
Volatile Acids (µeq/g) | ≤ 0.16 |
Chloride (Cl) | ≤ 1 ppm |
Nitrate (NO₃) | ≤ 2 ppm |
Sulfate (SO₄) | ≤ 12 ppm |
Trace Impurities - Aluminum (Al) | ≤ 0.500 ppm |
Trace Impurities - Antimony (Sb) | ≤ 10.000 ppm |
Trace Impurities - Arsenic (As) | ≤ 0.050 ppm |
Trace Impurities - Calcium (Ca) | ≤ 1.500 ppm |
Trace Impurities - Chromium (Cr) | ≤ 0.200 ppm |
Trace Impurities - Cobalt (Co) | ≤ 0.050 ppm |
Trace Impurities - Copper (Cu) | ≤ 0.050 ppm |
Trace Impurities - Gold (Au) | ≤ 0.300 ppm |
Trace Impurities - ACS - Heavy Metals (as Pb) | ≤ 5 ppm |
Trace Impurities - Iron (Fe) | ≤ 2.000 ppm |
Trace Impurities - Lead (Pb) | ≤ 0.300 ppm |
Trace Impurities - Lithium (Li) | ≤ 0.100 ppm |
Trace Impurities - Magnesium (Mg) | ≤ 0.20 ppm |
Trace Impurities - Manganese (Mn) | ≤ 0.100 ppm |
Trace Impurities - Nickel (Ni) | ≤ 0.200 ppm |
Trace Impurities - Potassium (K) | ≤ 1.500 ppm |
Trace Impurities - Sodium (Na) | ≤ 2.500 ppm |
Trace Impurities - Strontium (Sr) | ≤ 0.100 ppm |
Trace Impurities - Titanium (Ti) | ≤ 0.300 ppm |
Trace Impurities - Zinc (Zn) | ≤ 2.000 ppm |
Particle Count - 1.0 µm and greater | ≤ 10 par/ml |
For Microelectronic Use | |
Storage Conditions | Store at temperatures above 22°C (72°F) |
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