Hydrogen peroxide 30% stabilized, CMOS for the electronics industry, J.T.Baker®

Supplier: AVANTOR PERFORMANCE MATERIAL LLC


Management of Change (MOC) category = R

BAKR2200-07 BAKR2200-09 2200-10 2200-AN 2200-2J BAKR2200-2J BAKR2200-AN 2200-07 BAKR2200-10 2200-09
CAJT2200-9EA 2409.72 CAD
CAJT2200-9 CAJT2200-AN CAJT2200-10 JT2200-2J CAJT2200-7 JT2200-9 CAJT2200-2J JT2200-10 JT2200-7 JT2200-AN
Hydrogen peroxide 30% stabilized, CMOS for the electronics industry, J.T.Baker®
Hydrogen peroxide
Formula: H₂O₂
MW: 34.01 g/mol
Boiling Pt: ∼107 °C (1013 hPa)
Melting Pt: < 0 °C
Density: 1.11 g/cm³ (20 °C)
MDL Number: MFCD00011333
CAS Number: 7722-84-1
UN: 2014
ADR: 5.1,II

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Specification Test Results

For Microelectronic Use
Assay (H₂O₂) 30.0 - 32.0 %
Color (APHA) ≤ 10
Free Acid (µeq/g) ≤ 0.2
Residue after Evaporation ≤ 10 ppm
Ammonium (NH₄) ≤ 3 ppm
Chloride (Cl) ≤ 0.2 ppm
Nitrate (NO₃) ≤ 2 ppm
Phosphate (PO₄) ≤ 1 ppm
Sulfate (SO₄) ≤ 3 ppm
Trace Impurities - Aluminum (Al) ≤ 70.0 ppb
Trace Impurities - Antimony (Sb) ≤ 10.0 ppb
Trace Impurities - Arsenic (As) ≤ 10.0 ppb
Arsenic and Antimony (as As) ≤ 10.0 ppb
Trace Impurities - Barium (Ba) ≤ 20.0 ppb
Trace Impurities - Beryllium (Be) ≤ 10.0 ppb
Trace Impurities - Bismuth (Bi) ≤ 20.0 ppb
Trace Impurities - Boron (B) ≤ 10.0 ppb
Trace Impurities - Cadmium (Cd) ≤ 10.0 ppb
Trace Impurities - Calcium (Ca) ≤ 50.0 ppb
Trace Impurities - Chromium (Cr) ≤ 20.0 ppb
Trace Impurities - Cobalt (Co) ≤ 10.0 ppb
Trace Impurities - Copper (Cu) ≤ 10.0 ppb
Trace Impurities - Gallium (Ga) ≤ 20.0 ppb
Trace Impurities - Germanium (Ge) ≤ 10.0 ppb
Trace Impurities - Gold (Au) ≤ 10.0 ppb
Heavy Metals (as Pb) ≤ 500.0 ppb
Trace Impurities - Iron (Fe) ≤ 50.0 ppb
Trace Impurities - Lead (Pb) ≤ 10.0 ppb
Trace Impurities - Lithium (Li) ≤ 10.0 ppb
Trace Impurities - Magnesium (Mg) ≤ 10.0 ppb
Trace Impurities - Manganese (Mn) ≤ 10.0 ppb
Trace Impurities - Molybdenum (Mo) ≤ 10.0 ppb
Trace Impurities - Nickel (Ni) ≤ 10.0 ppb
Trace Impurities - Niobium (Nb) ≤ 10.0 ppb
Trace Impurities - Potassium (K) ≤ 600.0 ppb
Trace Impurities - Silicon (Si) ≤ 100.0 ppb
Trace Impurities - Silver (Ag) ≤ 10.0 ppb
Trace Impurities - Sodium (Na) ≤ 100.0 ppb
Trace Impurities - Strontium (Sr) ≤ 10.0 ppb
Trace Impurities - Tantalum (Ta) ≤ 10.0 ppb
Trace Impurities - Thallium (Tl) ≤ 50.0 ppb
Trace Impurities - Tin (Sn) 190.0 - 500.0 ppb
Trace Impurities - Titanium (Ti) ≤ 10.0 ppb
Trace Impurities - Vanadium (V) ≤ 10.0 ppb
Particle Count - 0.2 µm and greater ≤ 1175 par/ml
Trace Impurities - Zinc (Zn) ≤ 50 ppb
Trace Impurities - Zirconium (Zr) ≤ 10.0 ppb
Particle Count at point of fill - 0.5 µm and greater ≤ 100 par/ml

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